Level AFM

„Level AFM“ is a flexible Atomic Force Microscope for scientists. It offers a wide range of modes, sophisticated spectroscopy options and the programming of user defined experiments. Besides standard options found in Anfatec's other AFMs, the level AFM allows to add Anfatec's full range of AFM options, such as KPFM, closed loop operation, automated sample motion, acoustic enclosure, humidity and temperature control ... Each instrument is adapted to the user's specific needs.

Some special features:

a maximum scanning range of X-Y> 50 µm;

a maximum scanning range of Z> 5 μm;

X-Y resolution ≤ 2 nm;

Z resolution ≤ 0.2 nm;

maximum dimensions of the test specimen (length x width) ≥ (20x20) mm;

maximum height of test specimen ≥ 5 mm;

maximum positioning range of the test specimen ≥ 10 mm displacement along X and Y;

housing for sound and electromagnetic isolation;

controller with 24-bit (ADC and DAC) conversion bit;

dual surveillance camera with simultaneous top and side view;

3D data acquisition and analysis software.

Industrial grade PC with Windows 10 Pro - 64 bit

New Low noise laser module
available now!

Example Images from some more advanced applications:

Kelvin Probe Force Microscopy


	AM-KPFM image of an Al / silicon surface taken with a DEP01 cantilever with Pt coating. Topography (left) and Surface Potentoal (right). The Al wire is buried into the silicon surface and shows the more positive surface potential. The silicon is covered with a thin oxide laser and the surface potential slightly decays in dependence on the distance from the Al edge.


	Resonance enhanced FM-KPFM image of an Al / silicon surface taken with a DEP01 cantilever with Pt coating. Topography (left) and Surface Potentoal (right). In comparison to the AM-KPFM image, the potential contrast is better localized due to the side band detection. There are also more potential features visible on the Al surface. The potential difference between Al and Si is measured with 190 mV.

Magnetic Force Microscopy(2^nd trace imaging)

Magnetic Force Microscopy


	Topography (left) and MFM Amplitude (right) images of a Bruker reference sample for MFM. Image Size: 1.5 ï¿½m x 1.5 ï¿½m.


	Topography (left) and MFM Phase (right) images of a Bruker reference sample for MFM. Image size: 40 ï¿½m x 40 ï¿½m.

Electrical Force Microscopy

EFM Mode (Single trace)


Topography FWD	EFM Signal 1st Harmonic FWD	EFM Signal 2nd Harmonic FWD

EFM Mode (Dual trace = Lift Mode)


Topography FWD	2nd Trace Amplitude FWD	2nd Trace Phase FWD

Data Sheet

System parameters:

lateral resolution	better than 2 nm (at standard samples)
height resolution	better than 0.2 nm (atomic steps)
maximum scan range	> 50 µm
maximum sample size	2 cm x 2 cm
manual positioning range	10 mm x 10 mm
accessories	cantilevers of different types, small empty cantilever boxes, tweezers, sample holders

Optional Features

Optional features for Anfatec AFMs

EFM Module for AM-KPFM and FM-KPFM
passive Vibration isolation table under the microscope
active Vibration isolation table under the microscope
separate tip contact for EFM
closed loop scanner with sensors
glass bell jar for acoustic protection
glass bell jar for vacuum application
Aluminum ground plate with pump for vacuum applications
acoustic enclosure with/without humidity and temperature control
additional cantilever packages and gratings
enhanced LFM mode sensitivity (spot like laser diode)
external lockin amplifier(s)
Humidity sensor for glass bell jar
EFM head with IR laser diode for semiconductor EFM applications
Low noise laser module

Anfatec Present

filter functions (high pass, low pass, Fourier, noise, mean,..)
enhanced line and plane correction
data import and export
shows image information
histogram for brightness /contrast
colour palette variable
3D view
line and roughness analysis, FFT
copy function to other windows tools
unit cell correction (also for Omicron pictures)
analysis of integrated spectroscopy data