Anfatec Instruments AG
Measurement Science and Technology &
Scanning Probe Microscopy
Scanning Kelvin Probe System moves the KP-Head in vertical direction in
order to realize an motorized approach between the KP Probe and the
Sample. The Samples are mounted on a Vacuum Chuck that moves the Sample
150 mm by 150 mm across the Base Frame.
Like in the Single Point KP System, the KP Head can be easily exchanged.
Parameters and Special Features:
The system is delivered with the Thomson II controller and a Windows
PC. A Scripting Language allows the user to define Measurement
Procedures and provides maximum flexibility.
This system can be scaled to up to 70 cm x 50 cm Sample Size. It can be equiped with an independently moving Top Contact whose function is checked with a capacitive circuit. Thus, surface layers on large scale glass substrates with electrode intersections can be analysed.