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This Single-Point Scanning Kelvin Probe System enables work function detection with mV resolution and extraordinary reproducibility due to motorized approach and integrated Faraday shield. |
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Based on 25 years experience in AFM design, Anfatec offers its own affordable AFM series and simultaneaously distributes Molecular Vista's extraordinary VistaScope for Nano-IR and sSNOM measurements in PiFM mode. |
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Partner
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phone: +49 37421 24212 fax: +49 37421 24221 |
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Anfatec Instruments AG |
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